A Comprehensive Review for Micro/Nanoscale Thermal Mapping Technology Based on Scanning Thermal Microscopy

LI Yifan, ZHANG Yuan, LIU Yicheng, XIE Huaqing, YU Wei

Journal of Thermal Science ›› 2022, Vol. 31 ›› Issue (4) : 976-1007.

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Journal of Thermal Science

热科学学报
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Journal of Thermal Science ›› 2022, Vol. 31 ›› Issue (4) : 976-1007. DOI: 10.1007/s11630-022-1654-1  CSTR: 32141.14.JTS-022-1654-1

A Comprehensive Review for Micro/Nanoscale Thermal Mapping Technology Based on Scanning Thermal Microscopy

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 31(4): 976-1007 https://doi.org/10.1007/s11630-022-1654-1

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